EL-measurements
This is a measuring method with which you can see into the cells of a solar module. It can be seen defects which affect the performance of a solar module..
Measuring procedure:
An external voltage is applied to the module. The tension results in a radiation of photons. The module is illuminated with radiation in the near infrared, invisible for the human eye. The radiation which is emitted by the module is stored by a photograph.
Documentation of defects
The recognizable defects affect the module performance and the lifetime of the module.
The following is a compilation of recognizable abnormalities:
- Microcracks
- Full cell breaks and cross-breaks
- Impurities in the cell
- Crystallization defects in the wafer
- interrupted contact finger and / or cell fractions
- electrical demarcations on the cell
- Footprints from the suboptimal manufacturing process of the cell
- Abnormalities caused by faulty manufacturing processes
These abnormalities or deficiencies and defects described can be detected by a EL-Photograph in a short time. It is possible to draw conclusions about material and workmanship.
